Parasitic turn-on of SiC MOSFETs – Turning a bug into a feature
Patrick Hofstetter achieved first place with "Parasitic turn-on of SiC MOSFETs-Turning a bug into a feature" at the PCIM Young Engineer Award 2020.
(Picture: Power & Beyond)
1/1 Back to the Article
:quality(80)/p7i.vogel.de/wcms/70/f1/70f126c56053e61ae57bc5a5fa25618d/0105428591.jpeg "0105428591")
:quality(80)/p7i.vogel.de/wcms/6d/f6/6df66e3912c31b58a5e677c5cfbfb7d7/0105404349.jpeg "0105404349")
:quality(80)/p7i.vogel.de/wcms/34/d0/34d085749304a9d2c33ab99665c26208/0105339507.jpeg "0105339507")
:quality(80)/p7i.vogel.de/wcms/fe/c4/fec4dbd5175317d8fa41f3a3e48cd8ff/0105158050.jpeg "0105158050")
:quality(80)/p7i.vogel.de/wcms/af/ae/afae3f3faf4e2dd766aafcb0c3e0bf53/0105409137.jpeg "0105409137")
:quality(80)/p7i.vogel.de/wcms/b4/5c/b45c61167369491ba1e87980d9f6d722/0105251889.jpeg "0105251889")
:quality(80)/p7i.vogel.de/wcms/64/80/648025a42458d6100ab39218464dcb96/0105271387.jpeg "0105271387")
CHIP SHORTAGE NEWS :quality(80)/p7i.vogel.de/wcms/04/a9/04a9c3c7191421252bf860af688bbf41/0105122809.jpeg "0105122809")
:quality(80)/p7i.vogel.de/wcms/a4/7d/a47dd1ba980bf97fcbe86170000d5faa/0105443196.jpeg "0105443196")
:quality(80)/p7i.vogel.de/wcms/0b/ab/0bab17d89b907f36540b899f3d881d73/0105356625.jpeg "0105356625")
:quality(80)/p7i.vogel.de/wcms/f3/41/f3417dc0f6a935cfd890e3ed84d854bc/0105290931.jpeg "0105290931")
:quality(80)/p7i.vogel.de/wcms/15/0a/150a2a05f531468a8b5d1ceb5816ee57/0105130393.jpeg "0105130393")
:quality(80)/p7i.vogel.de/wcms/5b/41/5b41d5dd178a3ef5b42896a68458d619/0105285142.jpeg "0105285142")
:quality(80)/images.vogel.de/vogelonline/bdb/1958400/1958412/original.jpg "This article by Martina Mincica focuses on the successful calibration of an open-loop DAC signal chain.")
:quality(80)/images.vogel.de/vogelonline/bdb/1951500/1951547/original.jpg "In practice, a digital twin is based on sensors that gather real-time data and connect to a cloud-based system that receives and processes it all.")
:quality(80)/images.vogel.de/vogelonline/bdb/1953400/1953406/original.jpg "EVM is a simple metric to quantify the combination of all signal impairments in a system.")
/cdn4.vogel.de/infinity/white.jpg "Patrick Hofstetter achieved first place with \"Parasitic turn-on of SiC MOSFETs-Turning a bug into a feature\" at the PCIM Young Engineer Award 2020.")
